Generalized Hertz model for bimodal nanomechanical mapping

• Aleksander Labuda,
• Marta Kocuń,
• Waiman Meinhold,
• Deron Walters and
• Roger Proksch

Beilstein J. Nanotechnol. 2016, 7, 970–982, doi:10.3762/bjnano.7.89

• experimental data and extract a shape and size of the tip interacting with a polystyrene surface. Keywords: bimodal atomic force microscopy; bimodal spectroscopy; contact mechanics; multifrequency; nanomechanical mapping; nanomechanics; Introduction Over the decades since its invention [1] the atomic force

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• that the image contrast is related to the signal-to-noise ratio and thus difficult to quantify for heterogeneous samples. The conclusions drawn here are on the basis of the optical impression of the authors. Comparing these observations with the bimodal-spectroscopy measurements on polystyrene from the